sensors#
Image sensors used to measure the light intensity at the output of an optical system.
Functions
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The standard deviation of the charge diffusion in a backilluminated CCD given by Janesick [2001]. |
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A function to compute the mean charge capture [Stern et al., 2004], the fraction of charge from each photon event retained in the central pixel. |
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The charge diffusion kernel convolved with a pixel and then integrated over the extent of each pixel. |
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Bandgap energy in silicon given by Ramanathan and Kurinsky [2020]. |
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Calculate the average pair-production energy in silicon given by Ramanathan and Kurinsky [2020]. |
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The asymptotic electron-hole pair production energy in silicon given by Ramanathan and Kurinsky [2020]. |
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Calculate the ideal quantum yield of a silicon detector for a given wavelength and temperature using the model given in Ramanathan and Kurinsky [2020]. |
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Calculate the Fano factor of a silicon detector for a given wavelength and temperature using the model given in Ramanathan and Kurinsky [2020]. |
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The asymptotic Fano factor in silicon given by Ramanathan and Kurinsky [2020]. |
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The fraction of incident energy transmitted through the oxide layer into the light-sensitive material. |
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The fraction of incident energy absorbed by the light-sensitive region of the sensor |
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Compute the average charge collection efficiency using the differential charge collection efficiency profile described in Stern et al. [1994]. |
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Calculate the effective quantum efficiency of a backilluminated detector. |
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The probability that a photon absorbed in the epitaxial silicon layer results in at least one photoelectron measured by the sensor. |
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A random sample from the distribution of measured electrons given the number of photons absorbed by the light-sensitive layer of the sensor. |
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A random sample from an approximate distribution of measured electrons given the number of photons absorbed by the light-sensitive layer of the sensor. |
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A random sample from the approximate distribution of measured electrons given the expected number of photons incident on the front surface of the sensor. |
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Compute the variance-to-mean ratio (VMR) of the number of electrons measured by the sensor using an analytic expression. |
Classes
An interface describing an imaging sensor that can be used as the last surface in an optical system. |
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An arbitrary imaging sensor described by a pixel grid and a light-sensitive material. |
Modules
Models of light-sensitive materials designed to be used by |