materials#
Simulate the interaction of light with transparent or reflective materials.
Functions
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A simple form of Snell's law which computes the cosine of the angle between the propagation direction inside the new medium and the interface normal. |
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Calculate the reflection and transmission coefficients of a multilayer stack using the method described in Yeh [1988]. |
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Calculate the reflectivity and transmissivity of a multilayer film or coating using the method in Windt [1998]. |
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Compute the fraction of energy absorbed for a particular layer in the multilayer stack. |
Classes
An interface for representing a single homogeneous layer or a sequence of homogeneous layers. |
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An isotropic, homogenous layer of optical material. |
An interface describing a sequence of layers. |
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An explicit sequence of layers. |
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A sequence of layers repeated an arbitrary number of times. |
An interface describing a generalized optical material. |
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Empty space, the default material. |
An interface describing a generalized reflective mirror. |
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A perfect mirror material. |
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A mirror where the reflectivity has been measured by an external source as a function of wavelength. |
A generalized multilayer material. |
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An interface describing a thin-film multilayer material. |
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A thin-film multilayer material. |
A generalized multilayer mirror coating. |
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A model of a mirror coating consisting of alternating layers of different materials. |
An interface describing a thin-film filter. |
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A model of a thin-film EUV filter, such as those manufactured by Luxel [Powell et al., 1990]. |
Modules
Roughness profiles between different layers in a multilayer stack. |
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A collection of transfer matrices for computing the efficiency of optical films and multilayers. |
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Meshes designed to support thin-film filters, such as the ones manufactured by Luxel [Powell et al., 1990]. |